Photonics West 2014 – February 2014



Precitech exhibited at Photonics West along with
Vision Research, TMC and Taylor Hobson.

On display at the show was an on-machine metrology (OMM) solution featuring Precitech’s Nanofom X and Taylor Hobson Aspheric Analysis Utility (AAU). The automated process consisted of cutting a 17 mm part on the Nanoform X, measuring the part on machine, analysis by AAU, and finally recutting to reduce the form error. A live demo was conducted in the booth.